• PXIe-6345  |  The PXI multi-function I/0 module   | PXle, 80-channel AI
  • PXIe-6345  |  The PXI multi-function I/0 module   | PXle, 80-channel AI

PXIe-6345 | The PXI multi-function I/0 module | PXle, 80-channel AI

Model: Model: PXIe-6345
Maximum number of single-end analog input channels: 80
Analog input resolution: 16 bits
Maximum sampling rate: 500 kS/s
Number of analog output channels: 2
Maximum update rate: 2.86MS /s
Bus connector: PXI Express
Maximum number of single-end analog input channels: 80
Analog input resolution: 16 bits
Maximum sampling rate: 500 kS/s
Number of analog output channels: 2
Maximum update rate: 2.86MS /s
Bus connector: PXI Express
  • PXIe-6345  |  The PXI multi-function I/0 module   | PXle, 80-channel AI

Desciption

Model: PXIe-6345
Maximum number of single-end analog input channels: 80
Analog input resolution: 16 bits
Maximum sampling rate: 500 kS/s
Number of analog output channels: 2
Maximum update rate: 2.86MS /s
Bus connector: PXI Express
Number of two-way digital channels: 24
Electrical signal measured: voltage
Analog input FIFO cache size: 4095 samples
Maximum number of differential analog input channels: 40
Current flow: -
Synchronous sampling: No
Analog input absolute accuracy: 1520 μV
Number of counters/timers: 4

PXle, 80-channel AI(16-bit, 500ks/s), 2-channel A0, 24-channel DIO, PXI multi-function I/0 module
The PXle-6345 offers analog 1/0, digital //0 and four 32-bit counters/timers for PWM, encoder, frequency, event counting and other applications. The device utilizes a high-throughput PCIExpress bus and multi-core optimized drivers and application software to provide high performance capabilities. Onboard NI-STC3 timing and synchronization technology provides advanced timing capabilities, including separate analog and digital timing engines and retrigger-able measurement tasks. The PXle-6345 is suitable for a wide range of applications from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurement.